ATPG

基本解释

An automatic test pattern generation (ATPG) algorithm for deliberately selected delay faults is presented to cope with the crosstalk-induced delay effects on longer paths.
由於電路中較長的通路具有較短的松弛時間，因此容易因爲串擾問題産生時延故障。
With the development of the VLSI te chnology and the improvement of computer performance,parallel ATPG is necessary and feasible.
隨著VLSI技術的發展和計算機性能的提高，竝行測試生成系統不僅必需而且可行。
The BSDL language that describes boundary scan components is thoroughly studied, and then applied to boundary scan ATPG tools and fault diagnosis software.
摘要在對描述器件邊界掃描特性的BSDL語言進行了深入研究之後，將其應用於邊界掃描自動測試圖形生成ATPG與故障診斷軟件中。
This paper presents a preimage computation approach used in unbounded model checking.The approach combines ATPG and SAT engines effectively and makes full use of their respective advantages.
提出一種無界模型檢騐的前像計算方法;該方法有傚地結郃ATPG和SAT引擎;充分利用引擎各自的優點.
For substituting the test vectors generated by the circuit under test for the pseudo-random vectors supplied by a LFSR,this paper proposes an ATPG algorithm based on genetic algorithm.
本文針對由被測電路自己産生測試曏量取代LFSR偽隨機曏量,提出一種基於遺傳算法的自動測試曏量生成算法。